The capture of measurement data from instrument displays without manual input and Internet dependency
Designed for metrology, testing, and industrial environments, our machine device module "reads" digital readings from measuring instrument displays (for instance, multimeters, oscilloscopes, analyzers) and transmits the data to the required IT platform.
You can use the solution as a part of TestPatron Automation Studio or a fully standalone product, independent of any platform.
Connect the module to your test and measurement equipment. Machine vision "reads" the display and turns it into digital data, removing manual input completely.
The instrument doesn't support digital communication interfaces.
The instrument doesn't have the ability to transmit data directly to the system.
Specialists have to read and record readings manually.
Recognizes digital readings from instrument displays.
Converts images into structured digital data.
Transfers data via open API directly into external or your system for further processing.
Operates fully offline, without cloud services or internet access.
Minimize manual work and data entry errors.
Connect instruments without digital outputs.
Increase test accuracy and repeatability.
The module works via an open API and can be easily connected to:
You receive ready-to-use digital data, available for processing in any programming language.
No specialized or expensive scanners are required:
This significantly reduces deployment costs and simplifies scaling.
The system can self-learn and adapt to support:
The solution remains up-to-date even as your measurement equipment fleet evolves.
Perfectly fits organizations with strict information security requirements, regulated environments, and isolated networks.
Easy distribution, maintenance, and updates across engineering teams.
Contact us, and we'll show you how to adapt the machine vision module to your workflows and equipment.
Fill out the form and we'll contact you within 24 hours to discuss how a machine vision solution can automate your measurement processes.